System Software by Santanu Chattopadhyay: Book Summary: Intended as a text for the undergraduate students of Computer Science and Master of Computer Applications (MCA), this comprehensive yet concise book introduces the reader to the recent Intel 32-bit architecture, its programming and associated system programs.
Intended as a text for the undergraduate students of Computer Science and Master of Computer Applications (MCA), this comprehensive yet concise book introduces the reader to the recent Intel 32-bit architecture, its programming and associated system programs. The text begins by giving an overview of major system software and proceeds to discuss the assembly language programming with a number of examples. Topics such as assemblers, linkers and microprocessor are dealt with using Netwide Assembler (NASM)—the free platform independent assembler to generate object code. All the stages of a compiler design, its important methodologies, and the recent design techniques of text editor along with the advance data structures used for this purpose are also covered in sufficient detail. Finally, the essential features of debuggers, their design techniques and, most importantly, the hardware and software support for designing a good debugger are described.
KEY FEATURES:. Gives a fairly large number of examples and problems to help students in understanding the concepts better. The text easily correlates theory with practice. Provides exhaustive discussion on Netwide Assembler (NASM).
From Canada to U.S.A.About this Item: 2007. Condition: As New. Dust Jacket Condition: As New. International Edition. Book Condition: BRAND NEW. International/Eastern Economy Edition, Paperback/Softcover with SAME TITLE, AUTHOR AND EDITION as listed.
ISBN and Cover design differs.100% IDENTICAL CONTENTS as U.S Edition. Standard Delivery within 7-14 business days ACROSS THE GLOBE.
We can ship to PO Box, APO address in US. International Edition Textbooks may bear a label (Not for sale in the U.S.
Or Canada) or (For sale in Asia only) or similar restrictions- printed only to discourage students from obtaining an affordable copy. US Court has asserted your right to buy and use International edition. Access code/CD may not provided with these editions. We may ship the books from MULTIPLE WAREHOUSES ACROSS THE GLOBE including Asia depending upon the availability of inventory.
Printed in English. Customer satisfaction guaranteed. Seller Inventory # 511 1. From Canada to U.S.A.About this Item: 2013.
Condition: As New. Dust Jacket Condition: As New. International Edition. Book Condition: BRAND NEW.
International/Eastern Economy Edition, Paperback/Softcover with SAME TITLE, AUTHOR AND EDITION as listed. ISBN and Cover design differs.100% IDENTICAL CONTENTS as U.S Edition. Standard Delivery within 7-14 business days ACROSS THE GLOBE. We can ship to PO Box, APO address in US. International Edition Textbooks may bear a label (Not for sale in the U.S. Or Canada) or (For sale in Asia only) or similar restrictions- printed only to discourage students from obtaining an affordable copy.
US Court has asserted your right to buy and use International edition. Access code/CD may not provided with these editions. We may ship the books from MULTIPLE WAREHOUSES ACROSS THE GLOBE including Asia depending upon the availability of inventory. Printed in English.
Customer satisfaction guaranteed. Seller Inventory # 304 2. From India to U.S.A.About this Item: PHI Learning Pvt. Condition: New. Embedded system, as a subject, is an amalgamation of different domains, such as digital design, architecture, operating systems, interfaces, and algorithmic optimization techniques.
This book acquaints the students with the alternatives and intricacies of embedded system design. It is designed as a textbook for the undergraduate students of Electronics and Communication Engineering, Electronics and Instrumentation Engineering, Computer Science and Engineering, Information Communication Technology (ICT), as well as for the postgraduate students of Computer Applications (MCA).
While in the hardware platform the book explains the role of microcontrollers and introduces one of the most widely used embedded processor, ARM, it also deliberates on other alternatives, such as digital signal processors, field programmable devices, and integrated circuits. It provides a very good overview of the interfacing standards covering RS232C, RS422, RS485, USB, IrDA, Bluetooth, and CAN. In the software domain, the book introduces the features of real-time operating systems for use in embedded applications. Various scheduling algorithms have been discussed with their merits and demerits. The existing real-time operating systems have been surveyed. Guided by cost and performance requirements, embedded applications are often implemented partly in hardware and partly in software.
The book covers the different optimization techniques proposed in the literature to take a judicious decision about this partitioning of application tasks. Power-aware design of embedded systems has also been dealt with. In its second edition, the text has been extensively revised and updated. Almost all the chapters have been modified and elaborated including detailed discussion on hardware platformsARM, DSP, and FPGA. The chapter on interfacing standards has been updated to incorporate the latest information. The new edition will be thereby immensely useful to the students, practitioners and advanced readers.
Salient Features Presents a considerably wide coverage of the field of embedded systems Discusses the ARM microcontroller in detail Provides numerous exercises to assess the learning process Offers a good discussion on hardwaresoftware codesign Printed Pages: 241. Seller Inventory # 77170BV 6. From India to U.S.A.About this Item: PHI Learning. From United Kingdom to U.S.A.About this Item: Taylor & Francis Inc, United States, 2018. Condition: New. Language: English. Brand new Book.
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniquesThis book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
Seller Inventory # AAZ822 12. From United Kingdom to U.S.A.About this Item: Taylor & Francis Inc, United States, 2018.
Condition: New. Language: English. Brand new Book.
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniquesThis book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips. Seller Inventory # AAZ822 15. From United Kingdom to U.S.A.About this Item: LAP Lambert Academic Publishing, Germany, 2012.
Condition: New. Language: English. Brand new Book.
Testing is now considered as one of the most important issues in the development process of integrated circuits. With the advent of deep sub-micron (DSM) technology, the tight constraints on power dissipation have created new challenges for testing low power VLSI circuits. This necessitates redesigning the traditional test techniques that do not account for power dissipation during test application. Test power is always expected to be higher than that in the normal mode of operation of a circuit.
High test power may lead to permanent or temporal damage of the chip. The objective of this thesis is to develop strategies to reduce test power consumption, considering both dynamic and leakage power, without compromising the fault coverage and thus increasing the manufacturing yield. Four different strategies (three for external testing and one for internal testing) have been developed in such a way that they require either zero or very small overhead in terms of area. The techniques also have no impact on fault coverage and functional critical path. Seller Inventory # KNV205 27.
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